• Zero-Error Systems (ZES) was founded in 2019 as a spin-off from Nanyang Technological University (NTU) in Singapore.
• Backed by over 30 years of combined industry experience in ultra-reliable power semiconductor design, ZES brings to the table a wealth of knowledge, expertise, and a deep understanding of the intricacies of our field.
• Groundbreaking patents and products in the fields of power management, error rate reduction in computing, and radiation protection for Commercial Off the Shelves (COTS) semiconductor devices for Space, Automotive and Power Management industries.
• Innovative, cost-effective, and flight-proven solutions to protect electronics against single-event latch-ups(SEL), soft errors, and radiation-induced failures.
- Protection for COTS FPGAs, microcontrollers, and other complex ICs in space
- Enabling use of advanced, non-radiation-hardened components in satellite syste
- Enabling robust error correction and seamless data exchange by providing virtually glitch-free and error-free voted outputs
- Radiation-hardened technology for mitigating Single-Event-Latchup (SEL) and Single-Event-Upset (SEU) in irradiation environments.
• Backed by over 30 years of combined industry experience in ultra-reliable power semiconductor design, ZES brings to the table a wealth of knowledge, expertise, and a deep understanding of the intricacies of our field.
• Groundbreaking patents and products in the fields of power management, error rate reduction in computing, and radiation protection for Commercial Off the Shelves (COTS) semiconductor devices for Space, Automotive and Power Management industries.
• Innovative, cost-effective, and flight-proven solutions to protect electronics against single-event latch-ups(SEL), soft errors, and radiation-induced failures.
- Protection for COTS FPGAs, microcontrollers, and other complex ICs in space
- Enabling use of advanced, non-radiation-hardened components in satellite syste
- Enabling robust error correction and seamless data exchange by providing virtually glitch-free and error-free voted outputs
- Radiation-hardened technology for mitigating Single-Event-Latchup (SEL) and Single-Event-Upset (SEU) in irradiation environments.
